Amped to present at the Italian National Observatory for Computer Forensics conference

On Friday, October 19, Amped will be attending the ONIF (The Italian National Observatory for Computer Forensics ) annual conference in Amelia, Italy. 

Join Marco Fontani, R&D Engineer at Amped Software, for his presentation entitled “Enhancement and Authentication of Digital Images and Video” to learn how Amped products assist in the analysis of image and video evidence for investigations.

For more info about ONIF and the event visit: http://www.onif.it/

ONIF is the Italian National Observatory of Computer Forensics, created by a pool of professionals in the field of digital and computer forensics. Its main goal is to promote the role of the ‘digital forensic expert witness’ as the subject that is capable of implementing existing best practices for the identification, acquisition, and analysis of digital evidence.